Scanning and Auger Electron Microscopy

M S E 552 XE

Course Description

Characterization of materials using scanning electron microscope (SEM), electron microprobe, and auger spectrometer. Compositional determination using energy and wavelength dispersive x-ray and Auger spectroscopies. Specimen preparation. Laboratory covers SEM operation.

3 credits tenative course rotation: Fall, Spring, Summer


Instructor Contact

Scott Chumbley

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