Scanning and Auger Electron Microscopy

M S E 552 XE


Course Description

Characterization of materials using scanning electron microscope (SEM), electron microprobe, and auger spectrometer. Compositional determination using energy and wavelength dispersive x-ray and Auger spectroscopies. Specimen preparation. Laboratory covers SEM operation.

3 credits tenative course rotation: Fall, Spring, Summer

Questions

Instructor Contact

Scott Chumbley

Registration Information

Course Dept
M S E
Course Number
552
Section
XE
Credit Hours
3
Semester
Fall 2017
Dates
Aug 21 - Dec 15
Prerequisites
PHYS 222
Max Enrollment
10
Delivery Fee
$390.00 *
* Delivery Fee is additional to Tuition & Fees.

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