Scanning and Auger Electron Microscopy

MAT E 452X/552 XE Cross Listed: M S E


Course Description

Characterization of materials using scanning electron microscope (SEM), electron microprobe, and auger spectrometer. Compositional determination using energy and wavelength dispersive x-ray and Auger spectroscopies. Specimen preparation. Laboratory covers SEM operation.

3 credits tenative course rotation: Fall, Spring, Summer

Questions

Instructor Contact

Scott Chumbley

Registration Information

Course Dept
MAT E
Course Number
452X/552
Section
XE
Credit Hours
3
Semester
Fall 2018
Dates
Aug 20 - Dec 14
Prerequisites
PHYS 222
Max Enrollment
6
Delivery Fee
$570.00 *
* Delivery Fee is additional to Tuition & Fees.

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